Facilities

Chemical Characterization

  • Fourier Transform Infrared (FT-IR)
    • FT-IR spectrometer (Jasco)
  • Spectrometry
    • UV/Vis Spectrophotometer (Jasco)
    • UV/Vis Spectrophotometer (Shimadzu, 2501PC)
    • Colour measurement spectrophotometer (BYK Gardner, BYK)
    • Fluorimeter (Tecan, InfiniteM200)
  • Chromatographic platform
    • Gas Chromatography (Tremetrics, Model 9001)
    • HPLC with UV-detector (Jasco)
    • Mass Spectrometer (MS, Ameter, Dycor System 1000)
    • Ion Chromatography (Waters)
    • FLPC (GE Healthcare, AKTA-UPC-900)
  • Microscopy
    • Polarized Light Microscope (Linkam Scientific Instruments, L-IMGSTN)
    • Fluorescence Microscope (Olympus, BX51M)

Polymer characterization

  • Size exclusion chromatography (SEC)
    • Size Exclusion Chromatography (Perkin Elmer, PL-EMD 960 Evaporative Light Scattering Detector)
    • Size Exclusion Chromatography (4 detectors, Malvern, TDA max)
    • Size Exclusion Chromatography (3 detectors, Viscotek, 270 Dual)
  • Thermal Analysis
    • Dynamic Mechanical Thermal Analysis (Triton, Tritec 2000)
    • High-resolution modulated thermogravimetric analysis (HiRes- MTGA, TA Instruments, TGA Q500)
    • Simultaneous Thermal Analysis (heat-flux DSC/TGA, TA Instruments, SDT Q600)
  • Differential Scanning Calorimetry (DSC)
    •  Modulated Differential Scanning Calorimetry (mDSC, TA instruments, Q100)
  • Near-campus facilities
    • Nuclear Magnetic Resonance (Varian, Unity 500)
    • Elemental Analyser (Fisons Instruments, EA-1108 Elemental Analyser)
    • Atomic Force Microscope (Veeco/Bruker, diInnova)
    • Scanning Electron Microscope with EDS (Philips, XL30)
    • Transmission Electron Microscope (FEI Company, Tecnai G2 200KV Twin lens)
  • Misceallenous
    • Vapour Pressure Osmometer (Gonotec, Osmomat 070)
    • Rotary Evaporator (Buchi, R210)
    • Particle Diffraction Light Scattering (Malvern, Hidro2000MU)
    • Contact Angle determination (Dataphysics, OCA 20)
    • Rheometer (Reologic Instruments, Stresstech)
    • Rheometer (Haake, Rheostress1)
    • Spin Coater (SPIN150, NPP)
    • Electrospinning (Multiphaser/Spellman, NE1000/30PN10)
    • Plasma Surface Modification (Diener Electronic, Femto UHP)
    • Surface tension (Lauda, Lauda TD1)
    • Nanoindenter (Micromaterials, MML Nanotest)
    • X-ray diffractometer with hot chamber (Philips, X’Pert)
    • X-ray diffractometer with stress analysis (PANalytical, X’Pert PRO)

Facilities Gallery